System and method for testing voltage endurance

ABSTRACT

A method for testing voltage endurance of a electronic component, includes: generating an oscillating signal; amplifying the oscillating signal; transforming the amplified oscillating signal to generate a transformed signal; blocking a negative voltage of the transformed signal to generate a test signal to be transmitted to the electronic component; and detecting electrical characteristics of the electronic component to generate result data.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention generally relates to a test system and,particularly, to a system and method for testing voltage endurance.

2. Description of Related Art

Electronic devices usually include many kinds of electronic components,such as diodes, bipolar junction transistors, MOSFETs, and capacitors.Breakdown voltage is an important parameter when evaluating performanceof the electronic components. Take a diode as an example, if thebreakdown voltage of the diode is below a certain minimum as required bythe electronic device, the diode will conduct reversely, which cancauses unexpected results.

A voltage endurance of an electronic component is tested beforeassembling the electronic component into the electronic device so as tomake sure the electronic component will not be damaged by a largestvoltage in the electronic device. Referring to FIG. 5, a traditionaltest apparatus 500 includes a microcontroller 510, a digital to analog(D/A) converter 520, a power amplifier 530, and a transformer 540. Themicrocontroller 510 generates a digital signal and transmits the digitalsignal to the D/A converter 520. The digital signal is converted into ananalog signal by the D/A converter 520. The analog signal is thenamplified and transmitted to the transformer 540 by the power amplifier530. The transformer 540 transforms voltage of the amplified analogsignal to generate an alternating current (AC) voltage. The AC voltageis transmitted to the electronic component as a test signal for testingthe electronic component.

However, a negative voltage in the test signal will affect precision ofa test result. For example, a negative electric potential generated bythe negative voltage and stored in capacitors will counteract a part ofthe test signal in positive voltage.

Therefore, an improved system and method for testing voltage enduranceis desired.

SUMMARY OF THE INVENTION

A system for testing voltage endurance of an electronic component,includes a signal generator, a power amplifier, a transform unit, asignal adjust unit, and a voltage reading module. The signal generatoris used for generating an oscillating signal. The power amplifier isconnected to the signal generator for receiving and amplifying theoscillating signal. The transform unit is coupled to the power amplifierfor transforming the amplified oscillating signal to generate atransformed signal. The signal adjust unit is constructed and arrangedfor blocking a negative voltage of the transformed signal to generate atest signal to be transmitted to the electronic component. The voltagereading module is coupled to the electronic component for detectingelectrical characteristics of the electronic component to generateresult data.

A method for testing voltage endurance of an electronic component,includes: generating an oscillating signal; amplifying the oscillatingsignal; transforming the amplified oscillating signal to generate atransformed signal; blocking a negative voltage of the transformedsignal to generate a test signal to be transmitted to the electroniccomponent; and detecting electrical characteristics of the electroniccomponent to generate result data.

Other advantages and novel features will become more apparent from thefollowing detailed description of preferred embodiments when taken inconjunction with the accompanying drawings, in which:

BRIEF DESCRIPTION OF THE DRAWINGS

Many aspects of the system and method for testing voltage endurance canbe better understood with reference to the following drawings. Thecomponents in the drawings are not necessarily to scale, the emphasisinstead being placed upon clearly illustrating the principles of thepresent system. Moreover, in the drawings, like reference numeralsdesignate corresponding parts throughout the several views.

FIG. 1 is a block diagram of a test system in accordance with anexemplary embodiment;

FIG. 2 is a detailed block diagram of the test system of FIG. 1;

FIG. 3 is a schematic diagram of an exemplary circuit; and

FIG. 4 is a flow chart illustrating a procedure of a method for testingvoltage endurance in accordance with an exemplary embodiment.

DETAILED DESCRIPTION OF THE INVENTION

Reference will now be made to the drawings to describe a preferredembodiment of the present system and method for testing voltageendurance.

Referring to FIG. 1, a block diagram of a test system 100 for testingvoltage endurance of an electronic component 200 in accordance with anexemplary embodiment is illustrated. The test system 100 includes asignal module 110, a voltage reading module 120, a control module 130, adisplay apparatus 140, and a clamp apparatus 150.

The signal module 110 is configured to connected to the electroniccomponent 200 and to transmit a test signal to the electronic component200.

The voltage reading module 120 is used for detecting the electroniccomponent 200 while the test signal is transmitted to the electroniccomponent 200.

The control module 130 is coupled to the voltage reading module 120, thedisplay apparatus 140, and the clamp apparatus 150 respectively. Thecontrol module 130 is configured for receiving result data from thevoltage reading module 120, controlling information displayed on thedisplay apparatus 140, and signaling the clamp apparatus 150 to clamp orrelease the electronic component 200. Before testing the voltageendurance of the electronic component 200, the clamp apparatus 150clamps the electronic component to be connected to the test system 100.

Referring to FIG. 2, a detailed block diagram of the test system 100 isillustrated. The signal module 110 includes a signal generator 112, apower amplifier 114, a transform unit 116, and a signal adjust unit 118.

The signal generator 112 is configured for outputting an oscillatingsignal. The signal generator 112 can be selected from a group consistingof a resistor-capacitor (RC) oscillator, a timer circuit, and any othersine wave or square wave signal generating circuits.

The power amplifier 114 is connected to the signal generator 112 forreceiving and amplifying the oscillating signal. The power amplifier 114can be selected from a group consisting of a transistor amplifier and anintegrated circuit amplifier.

The transform unit 116 is coupled to the power amplifier 114 fortransforming the amplified oscillating signal to a transformed signal.

The signal adjust unit 118 is configured for receiving and adjusting thetransformed signal to generate the test signal, such as blockingnegative voltages in the transformed signal.

The test signal is transmitted to the electronic component 200 fortesting the electronic component 200. The voltage reading module 120 iscoupled to the electronic component 200 for detecting electricalcharacteristics of the electronic component 200, such as a voltage ofthe electronic component 200. The result data outputted by the voltagereading module 120 based on the electrical characteristics istransmitted to the control module 130 for further analyzing. Generally,if the electronic component 200 is damaged, a resistance of theelectronic component 200 drops near to zero rapidly. Thus the voltage ofthe electronic component 200 drops accordingly.

The control module 130 includes a processor 132 and a storage unit 134.The storage unit 134 is used for storing a predetermined value. Theprocessor 132 is configured for comparing the result data with thepredetermined value, so as to determine whether the electronic component200 meets a predefined design requirement, in a preferred embodiment thedesign requirement represent a voltage endurance value that indicatesthe electronic component 200 is eligible for being assembled in anelectronic device. If the electronic component 200 is eligible for beingassembled in the electronic device, the processor 132 sends a firstinstruction to the display apparatus 140 and the clamp apparatus 150. Inresponse to the first instruction, the display apparatus 140 displayseligible information of the electronic component 200 on the displayapparatus 140, and the clamp apparatus 150 releases the electroniccomponent 200 to a first area that stores eligible tested electroniccomponents and clamps a next electronic component 200. If the electroniccomponent 200 is not eligible for being assembled in the electronicdevice, the processor 132 sends a second instruction to the displayapparatus 140 and the clamp apparatus 150. In response to the secondinstruction, the display apparatus 140 displays that the electroniccomponent 200 is not eligible for being assembled in the electronicdevice on the display apparatus 140, and the clamp apparatus 150releases the electronic component 200 to a second area that storesineligible electronic components and clamps the next electroniccomponent. Exemplarily, the clamp apparatus 150 is a pneumatic clamp.

Referring to FIG. 3, a schematic diagram of an exemplary circuit isillustrated. In the exemplary circuit, a test diode D is employed as anexample of the electronic component 200. The signal generator 112includes a timer Integrated Circuit (IC) U1, a variable resistor W1,five resistors R1˜R5, five capacitors C1-C5, and a switch S1. The poweramplifier 114 includes a MOSFET Q1 and a resistor R6. The transform unit116 includes a transformer T1. The signal adjust unit 118 includes ablocking diode D1 and resistors R7˜R9. The voltage reading module 120includes a digital multimeter 122. The control module 130 is a computer136 connected to the digital multimeter 122 via a RS-232 interface. Thedisplay module 140 is a LCD monitor 142 coupled to the computer 136 fordisplaying information.

The timer IC U1 includes a ground port GND, a control port CONT, atrigger port TRIG, a reset port REST, a voltage supply port VCC, anoutput port OUT, a discharge port DISCH, and a threshold port THRES. Theground port GND and the control port CONT are connected to the ground.The trigger port TRIG is connected to a common node 302 of thecapacitors C1˜C5 via the resistor R1 and the variable resistor W1. Thethreshold port THRES is connected to the common node 302. The dischargeport DISCH is connected to one end of the switch S1 via the resistor R3,another end of the switch S1 can be selectively connected to thecapacitors C1˜C5. The output port OUT is connected to ground via theresistor R4 and the resistor R5. The reset port REST is connected to avoltage source terminal 310 via the resistor R2. The voltage supply portVCC is connected to the voltage source terminal 310 directly.

An end of a primary winding of the transformer T1 is connected to thevoltage source terminal 310, another end of the primary winding of thetransformer T1 is connected to the drain terminal of the MOSFET Q1. Thesource terminal of the MOSFET Q1 is grounded via the resistor R6. Thegate terminal of the MOSFET Q1 is connected to the interconnectionbetween the resistor R4 and the resistor R5. An end of a secondarywinding of the transformer T1 is grounded; another end of the secondarywinding of the transformer T1 is connected to the anode of the blockingdiode D1. The cathode of the blocking diode D1 is connected to thecathode of the test diode D via the resistor R7 and the resistor R8. Theanode of the test diode D is grounded. The resistor R9 and the digitalmultimeter 122 are connected in serial and then are parallel to theresistor R8 and the test diode D.

In operation, the oscillating signal is generated by the timer IC U1 andoutputted from the output port OUT. A frequency and duty of theoscillating signal can be adjusted by adjusting the variable resistor W1and selecting one of the capacitors C1˜C5. The oscillating signal isamplified by the MOSFET Q1. The gate terminal of the MOSFET Q1 isconnected to the interconnection between the resistor R4 and theresistor R5, thus a voltage inputted to the gate terminal can beadjusted by setting resistance values of the resistor R4 and theresistor R5.

The drain terminal of the MOSFET Q1 is connected to the primary windingof the transformer T1, the amplified oscillating signal is transmittedto the transformer T1. The transformer T1 transforms the amplifiedoscillating signal to generate the transformed signal and output thetransformed signal from the secondary winding. The transformed signal istransmitted to the blocking diode D1. The blocking diode D1 isconfigured for blocking the negative voltage in the transformed signaland generating the test signal. The resistors R7 and R8 are seriallyconnected to the test diode D for dividing the voltage applied on thetest diode D. The digital multimeter 122 generates the result dataaccording to the voltage detected from the test diode D. The result datais transmitted to the computer 136 via the RS-232 interface. Thecomputer 136 determines whether the test diode D is eligible or noteligible for being assembled in the electronic device. Generally, thetest signal is configured to output the largest voltage to be applied tothe test diode. If the test diode D is not breakdown under the largestvoltage, thus the digital multimeter 122 will detect a voltage valueclose to the largest voltage, and the test diode D is eligible for beingassembled in the electronic device. If the test diode D is breakdownunder the largest voltage, the resistance of the test diode D dropsrapidly to almost zero and the voltage of the test diode D dropsaccordingly. Thus the test diode D is not eligible for being assembledin the electronic device.

The test system 100 blocks the negative voltage by the blocking diodeD1, thus an effect of the negative voltage is avoided. The oscillatingsignal is generated by the timer IC U1, thus the microcontroller anddigital to analog converter are not required by the test system 100. Theclamp apparatus 150 clamps and releases the electronic component 200automatically under the control of the control module 130. Therefore,prevention actions for electrostatic discharge of manually operation arenot required.

Referring to FIG. 4, an exemplary method for testing the voltageendurance of the electronic component 200 is illustrated. First, in step402, the clamp apparatus 150 clamps the electronic component 200 andconnects the electronic component 200 to the test system 100.

Then in step 404, the signal generator 112 outputs the oscillatingsignal.

In step 406, the power amplifier 114 receives and amplifies theoscillating signal.

In step 408, the transform unit 116 transforms the amplified oscillatingsignal to generate the transformed signal that includes the largestvoltage to test the electronic component 200.

In step 410, the signal adjust unit 118 receives and adjusts thetransformed signal to generate the test signal.

In step 412, the voltage reading module 120 detects the electricalcharacteristics of the electronic component 200, such as the voltage ofthe electronic component 200. The result data generated by the voltagereading module 120 based on the electrical characteristics istransmitted to the control module 130 for further analyzing.

In step 414, the control module 130 determines whether the electroniccomponent 200 is eligible or not eligible for being assembled in theelectronic device. If the electronic component 200 is eligible for beingassembled in the electronic device, the first instruction is sent to thedisplay apparatus 140 and the clamp apparatus 150. In response to thefirst instruction, the display apparatus 140 displays the eligibleinformation on the display apparatus 140, and the clamp apparatus 150releases the electronic component 200 to the first area for storing theeligible electronic components and clamps the next electronic component(step 416). If the electronic component 200 is not eligible for beingassembled in the electronic device, the second instruction is sent tothe display apparatus 140 and the clamp apparatus 150. In response tothe second instruction, the display apparatus 140 displays theineligible information on the display apparatus 140, and the clampapparatus 150 releases the electronic component 200 to the second areafor storing the ineligible electronic components and clamps the nextelectronic component (step 418).

The embodiments described herein are merely illustrative of theprinciples of the present invention. Other arrangements and advantagesmay be devised by those skilled in the art without departing from thespirit and scope of the present invention. Accordingly, the presentinvention should be deemed not to be limited to the above detaileddescription, but rather by the spirit and scope of the claims thatfollow, and their equivalents.

1. A system for testing voltage endurance of an electronic component,comprising: a signal generator for outputting an oscillating signal; apower amplifier connected to the signal generator for receiving andamplifying the oscillating signal, thereby yielding an amplifiedoscillating signal; a transform unit coupled to the power amplifier fortransforming the amplified oscillating signal thereby yielding atransformed signal; a signal adjust unit configured for blocking anegative voltage of the transformed signal and generating a test signalto be transmitted to the electronic component; and a voltage readingmodule coupled to the electronic component for detecting electricalcharacteristics of the electronic component when the test signal istransmitted to the electronic component and generating result dataaccording to the electrical characteristics.
 2. The system as claimed inclaim 1, wherein the signal generator comprises a timer integratedcircuit for generating the oscillating signal.
 3. The system as claimedin claim 2, wherein the signal generator further comprises a variableresistor and a plurality of capacitors connected to the timer IC.
 4. Thesystem as claimed in claim 3, wherein a frequency and duty cycle of theoscillating signal can be adjusted by adjusting the variable resistorand selecting one of the plurality of capacitors.
 5. The system asclaimed in claim 1, wherein the power amplifier comprises a MOSFET, thegate terminal of the MOSFET is connected to the signal generator forreceiving and amplifying the oscillating signal.
 6. The system asclaimed in claim 1, wherein the transform unit is a transformer.
 7. Thesystem as claimed in claim 6, wherein the signal adjust unit comprises adiode for blocking the negative voltage in the transformed signal. 8.The system as claimed in claim 1, wherein the signal adjust unit furthercomprises a resistor for dividing a voltage of the transformed signal.9. The system as claimed in claim 1, wherein the system furthercomprises a control module for computing whether the electroniccomponent is eligible for being assembled in an electronic device basedon the result data.
 10. The system as claimed in claim 9, wherein thecontrol module further comprises a storage unit for storing apredetermined value and a processor for comparing the result data withthe predetermined value to determine whether the electronic component iseligible for being assembled in the electronic device.
 11. The system asclaimed in claim 9, wherein the system further comprises a displayapparatus for displaying eligible information and ineligibleinformation.
 12. The system as claimed in claim 9, wherein the systemfurther comprises a clamp apparatus for clamping and releasing theelectronic component.
 13. The system as claimed in claim 12, wherein theclamp apparatus is a pneumatic clamp.
 14. A method for testing voltageendurance of an electronic component, comprising: outputting anoscillating signal; amplifying the oscillating signal thereby yieldingan amplified signal; transforming the amplified signal thereby yieldinga transformed signal; blocking a negative voltage of the transformedsignal to generate a test signal to be transmitted to the electroniccomponent; and detecting electrical characteristics of the electroniccomponent to generate result data.
 15. The method as claimed in claim14, wherein a frequency and duty cycle of the oscillating signal isadjustable.
 16. The method as claimed in claim 14, further comprising:determining whether the electronic component is eligible for beingassembled in an electronic device based on the result data.
 17. Themethod as claimed in claim 16, further comprising: displaying eligibleinformation and ineligible information.
 18. The method as claimed inclaim 14, further comprising: displaying the result data.